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Dr. Hartmut Bielefeldt
address:
Galleyenstrasse 19/2
D-88048 Friedrichshafen
Germany
e-mail: Hartmut Bielefeldt
born: 1965
nationality: German
married
Education and professional background
1984 | Abitur (high school graduation) |
1984-1985 | Military service (surveying duties in artillery) |
1985-91 | Study of physics at Konstanz University, Germany |
1984-1989 (5 summers) | different practical trainings at Dornier GmbH company, Friedrichshafen: numerical simulations, data acquisition and optimization procedures for magnet assemblies in wigglers for free electron lasers; programming of numerical simulations for several other problems in physics |
1990-91 | Diploma thesis in scanning force and friction microscopy at Univ. of Konstanz |
June 1991 | Diploma in physics |
1991-94 | Ph.D. thesis at Konstanz University:
opical near-field microscopy in reflection and transmission
Applications: semiconductor characterization, polymer mixtures |
Sept. 1994 | Ph.D. degree |
Jan.-Sept. 1995 | Postdoctoral stay (9 months) at Laboratoire d'Optique P.M. Duffieux, Université de Franche-Comté, Besançon (France): Design, construction and operation of a
combined scanning force and optical near-field microscope (Human Capital and Mobility Program of the European Union) |
Oct. 95-Sept. 96 | Postdoctoral stay at the IBM Research Laboratory Zürich/Rüschlikon, Switzerland: Scanning near-field optical microscopy (applications, technical development, questions of image interpretation)
(Human Capital and Mobility Program) |
Oct. - Dec. 1996 | Construction of a scanning near-field optical microscope for semiconductor investigations using ultrashort laser pulses in the near infrared (IBM Rüschlikon / ETH Zürich, IQE) |
March 1997 - Feb. 2002 | University of Augsburg: Scanning probe microscopy characterization of oxide thin films and crystals, numerical simulations of the scanning force microscopy imaging mechanism, low-temperature UHV scanning probe microscopy |
since May 2003 |
Sensor develompent (optoelectronic sensors) at ifm electronic GmbH, Meckenbeuren, Germany
since 2014: ifm efector gmbh, Tettnang, Germany |
Teaching
(Augsburg, 1997-2002)
- Seminars for undergraduate physics students
- exam preparation course for state examinations candidates in experimental physics
- responsible for the "Scanning Force Microscopy" experiment for undergraduate students ("Fortgeschrittenenpraktikum")
- responsibility for diploma and Ph.D. students
- casual lessons in basic and advanced physics courses (as a stand-in)
Skills
- excellent knowledge of software for data processing, graphics, CAD, text processing and databases, under Windows, DOS, OS/2, Unix, and Atari
- WWW design (homepage of the group at University of Augsburg, and many other projects)
- programming languages: Pascal, Fortran, APL, BASIC, PHP; HTML; Python
- analog electronics, data acquisition, image processing
- concept, realization and application of scanning probe microscopes (atomic force microscope, scanning near-field optical microscope, combined techniques)
- scanning electron microscopy, focused ion beam
- ultrahigh vacuum, low temperature, thin film techniques
- technology of optical fibers, optics, laser
Languages
- German: mother tongue
- English: fluent
- Spanish, French, Russian: basic knowledge
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Last updated October 30, 2014 by Hartmut Bielefeldt
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